Emerging Technology and Semiconductor Material Characterization

Journals

  1. N. G. Hallfors, D. Maksimovski, I. A. H. Farhat, M. Abi Jaoude, A. R. Devarajan, K. Liao, M. Ismail, H. Pade, R. Y. Adhikari, and A. F. Isakovic, "Layered, tunable graphene oxide-nylon composite heterostructures for wearable electrocardiogram sensors", Appl. Phys. Lett. 122, 013701 (2023)
  2. Nesrine Jaziri, Ayda Boughamoura, Jens Müller, Brahim Mezghani, Fares Tounsi, Mohammed Ismail, A comprehensive review of Thermoelectric Generators: Technologies and common applications, Energy Reports, Volume 6, Supplement 7, 2020, Pages 264-287, ISSN 2352-4847
  3. N. Hallfors, M. Alhawari, Y. kifle, M. Abi Jaoude, K. Liao, M. Ismail and A. Isakovic, “Graphene Oxide-Nylon ECG Sensors for Wearable IoT Health Care: Nanomaterial and SoC Interface” J.Analog Integrated Circuits and signal Processing, Springer, 2018.
  4. Abdulslam, B. Mohammad, M. Ismail, P. Mercier and Y. Ismail” A 93% peak Efficiency Fully Integrated Multi-Level Multi-State Hybrid DC-Dc Converter” IEEE Trans Circuits and Systems I, accepted to appear 2018.
  5. H. Abunahla ; B. Mohammad ; L. Mahmoud ; M. Darweesh ; M. Alhawari ; M. Abi Jaoude ; G. Wesley Hitt, "MemSens: Memristor-Based Radiation Sensor," in IEEE Sensors Journal, vol. 18, no. 8, pp. 3198-3205, 15 April, 2018.
  6. F. Adly, P. D. Yoo, S. Muhaidat, Y. Al-Hammadi, U. Lee, M. Ismail, “ Randomized general regression network for identification of defect patterns in semiconductor wafer maps” IEEE Trans Semiconductor Manufacturing. Vol.28, issue 2, pp.145-152, 2015
  7. F Adly, O. Alhussein, P. D. Yoo, Y. Al-Hammadi, K. Taha, S. Muhaidat, Y. Jeong, U. Lee, M. Ismail “Simplified Subspaced regression network for identification of defect patterns in semiconductor wafer maps” IEEE Trans. Industrial Informatics,vol.11, issue 6, pp.1267-1276, 2015.

Conference Papers

  1. M.Rezeq and M.Ismail” The Significant Effect of the Size of a Nanometal Particle on the Interface with a Semiconductor Substrate”, proc. Of the 12 IEEE Conference on Nanotechnology (IEEE Nano), Birmingham, UK, August 2012.
  2. M.Rezeq, K.Edelebi, I.Lababidi and M.Ismail,” Analysis of the Interface Barriers Between Nanometal Particles and Semiconductor Substrates”, Proc.of the IEEE Midwest Symposium on Circuits and Systems, Columbus, OH, PP.736-738, August 2013.
  3. N.El-Kork, F.Lei, M.Ismail, P.Moretti, and B.Jacquier” Gold Nanoplot hotspots simulation and Imaging” proc of The 56th IEEE Midwest Symp. on Circuits and Systems, Columbus, OH, PP.338-339, August 2013.
  4. Moh’d Rezeq, Khouloud Eledlebi , M. Ismail, Bo Cui, and Ripon Kumar Dey “Characterization of Nano Schottky Junctions for a New Structure of Nano-electronic Devices” IEEE NANO 2014, Toronto, Canada
  5. K. Eledlebi, M. Ismail and M. Rezeq, “Numerical analysis of nano schottky junctions for developing novel sub-20 nm electronic devices” Presented at the 2014 IEEE ICECS, Marseille, France.
  6. Moh’d Rezeqa, Khouloud Eledlebi, M. Ismail, Bo Cui and Ripon Kumar Dey,” Characterization of nano scale metal Schottky contacts with silicon substrates for scaling of electronic devices”MNE 2014: 40th Int Conference on Micro and Nano Engineering, Lausanne, Switzerland, September 2014.
  7. L. Mahmoud, M. Alhawari, Y. Abdul Samad, B. Mohammad, K. Liao, and M. Ismail, “Characterization of Graphene-Based Thermoelectric Generator (TEG) using Cost Effective Fabrication Process”, International Conference of Thermoelectrics (ICT2014), Tennessee, USA.